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Determination of Lead and Nickle in sweetener with D2 Background Correction Graphite Furnace AAS
The measurements were performed by using graphite furnace AAS technique with single beam mode with deuterium (D2) background correction at wavelength 217 nm and 232nm for lead (Pb) and nickle (Ni) respectively. A palladium-magnesium solution was called “Matrix Modifier” is added to the sample for getting rid of the matrix in the sample and for thermal stabilization of element during the decomposition step that proceeds atomization. The standard calibration curve was diluted automatically by using Autosampler.
ConsultingAbstract
Experimental:
The measurements were performed by using graphite furnace AAS technique with single beam mode with deuterium (D2) background correction at wavelength 217 nm and 232nm for lead (Pb) and nickle (Ni) respectively. A palladium-magnesium solution was called “Matrix Modifier” is added to the sample for getting rid of the matrix in the sample and for thermal stabilization of element during the decomposition step that proceeds atomization. The standard calibration curve was diluted automatically by using Autosampler.
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